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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems 2012 edition
Tomi Laurila
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems 2012 edition
Tomi Laurila
This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
240 pages, 113 black & white illustrations, 15 colour illustrations, biography
Media | Książki Hardcover Book (Książka z twardym grzbietem i okładką) |
Wydane | 13 stycznia 2012 |
ISBN13 | 9781447124696 |
Wydawcy | Springer London Ltd |
Strony | 218 |
Wymiary | 155 × 235 × 18 mm · 453 g |
Język | English |
Zobacz wszystko od Tomi Laurila ( np. Hardcover Book i Paperback Book )