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Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing 2013 edition
Elie Maricau
Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing 2013 edition
Elie Maricau
This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.
198 pages, 16 black & white tables, biography
Media | Książki Paperback Book (Książka z miękką okładką i klejonym grzbietem) |
Wydane | 19 czerwca 2015 |
ISBN13 | 9781489986306 |
Wydawcy | Springer-Verlag New York Inc. |
Strony | 198 |
Wymiary | 155 × 235 × 12 mm · 308 g |
Zobacz wszystko od Elie Maricau ( np. Hardcover Book i Paperback Book )