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Thin Film Materials: Stress, Defect Formation and Surface Evolution
Freund, L. B. (Brown University, Rhode Island)
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Thin Film Materials: Stress, Defect Formation and Surface Evolution
Freund, L. B. (Brown University, Rhode Island)
Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. Describing fundamental concepts with practical case studies, highly illustrated, thorough referencing and containing numerous homework problems, this book will be essential for graduate courses on thin films and the classic reference for researchers.
770 pages, 75 b/w illus. 75 exercises
| Media | Książki Hardcover Book (Książka z twardym grzbietem i okładką) |
| Wydane | 8 stycznia 2004 |
| ISBN13 | 9780521822817 |
| Wydawcy | Cambridge University Press |
| Strony | 770 |
| Wymiary | 180 × 255 × 43 mm · 1,64 kg (Waga (szacunkowa)) |
| Język | English |
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