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Self-Checking and Fault-Tolerant Digital Design - The Morgan Kaufmann Series in Computer Architecture and Design
Lala, Parag K. (North Carolina Agricultural and Technical State University)
Self-Checking and Fault-Tolerant Digital Design - The Morgan Kaufmann Series in Computer Architecture and Design
Lala, Parag K. (North Carolina Agricultural and Technical State University)
With VLSI chip transistors getting smaller and smaller, digital systems are more complex than before. This work deals with self-checking design techniques and emphasizes major techniques for hardware fault tolerance. It shows how to design self-checking sequential circuits. It also introduces reliability theory and importance of maintainability.
400 pages
Media | Książki Hardcover Book (Książka z twardym grzbietem i okładką) |
Wydane | 26 czerwca 2000 |
ISBN13 | 9780124343702 |
Wydawcy | Elsevier Science & Technology |
Strony | 400 |
Wymiary | 187 × 235 × 18 mm · 612 g |