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Advances in X-Ray Analysis: Volume 24 Softcover reprint of the original 1st ed. 1981 edition
D K Smith
Advances in X-Ray Analysis: Volume 24 Softcover reprint of the original 1st ed. 1981 edition
D K Smith
Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied.
428 pages, 164 black & white illustrations
Media | Książki Paperback Book (Książka z miękką okładką i klejonym grzbietem) |
Wydane | 12 grudnia 2012 |
ISBN13 | 9781461399926 |
Wydawcy | Springer-Verlag New York Inc. |
Strony | 428 |
Wymiary | 170 × 244 × 23 mm · 712 g |
Redaktor | Smith, D. K. |
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