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Electronic Basis of the Strength of Materials
Gilman, John J. (University of California, Los Angeles)
Electronic Basis of the Strength of Materials
Gilman, John J. (University of California, Los Angeles)
This 2003 book relates the strength characteristics of constituent atoms to the electronic structures. It begins with short reviews of classical and quantum mechanics followed by reviews of the three major branches of the strength of materials: elastic stiffnesses; plastic responses; and the nature of fracture.
292 pages, 10 b/w illus.
Media | Książki Hardcover Book (Książka z twardym grzbietem i okładką) |
Wydane | 20 marca 2003 |
ISBN13 | 9780521620055 |
Wydawcy | Cambridge University Press |
Strony | 292 |
Wymiary | 170 × 244 × 17 mm · 746 g |